commit | ac8a6a253ef878220ee232203df4bb65be42eccb | [log] [tgz] |
---|---|---|
author | mrg <mrg@ucsc.edu> | Sun Nov 07 10:18:21 2021 -0800 |
committer | mrg <mrg@ucsc.edu> | Sun Nov 07 10:18:21 2021 -0800 |
tree | 390eca4251eb28122675762736a9498af47df556 | |
parent | f854094c719d7148822fc8b9d8553292a60a42ef [diff] |
Change lef database units to 1000
:exclamation: Important Note |
---|
This project contains a test chip for several OpenRAM memory configurations. The configurations have varying levels of verification. In particular, it has these sizes:
There are two test modes available. Each one inputs an packet that configures the read and write operations of a particular SRAM. The GPIO pin io_in[16] determines whether to use GPIO (1) or LA mode (0).
The test packet is a 112-bit value that has the follow signals and bit size:
During a read operation, the din bits are replaced with the data output bits so that they can be verified.
Note: The 64-bit memory leaves the middle 32-bits as a value of 0 and instead reads/writes the upper and lower 16-bits to reduce the number of packet bits.
In GPIO mode, the test packet is scanned in/out with the GPIO pins in 112 cycles. The GPIO pins used are as follows:
In LA mode, the test packet is directly written from the output of the 128-bit LA. The top bits of the LA register are used for the control signals during test:
Jesse Cirimeli-Low jcirimel@ucsc.edu Amogh Lonkar alonkar@ucsc.edu Matthew Guthaus mrg@ucsc.edu