commit | 98ac71abbecd77dc96a83afb879c3dbad02075f4 | [log] [tgz] |
---|---|---|
author | mrg <mrg@ucsc.edu> | Sun Nov 14 16:02:36 2021 -0800 |
committer | mrg <mrg@ucsc.edu> | Sun Nov 14 16:02:36 2021 -0800 |
tree | d4aa56533ef9912bb58d050c2e547ffa26277a77 | |
parent | f9bf1d374d4ed55de36ffac6140d4cff3d8397a8 [diff] |
Delete user_proj_example
:exclamation: Important Note |
---|
This project contains a test chip for several OpenRAM memory configurations. The configurations have varying levels of verification. In particular, it has these sizes:
There are two test modes available. Each one inputs an packet that configures the read and write operations of a particular SRAM. The GPIO pin io_in[16] determines whether to use GPIO (1) or LA mode (0).
The test packet is a 112-bit value that has the follow signals and bit size:
During a read operation, the din bits are replaced with the data output bits so that they can be verified.
Note: The 64-bit memory leaves the middle 32-bits as a value of 0 and instead reads/writes the upper and lower 16-bits to reduce the number of packet bits.
In GPIO mode, the test packet is scanned in/out with the GPIO pins in 112 cycles. The GPIO pins used are as follows:
In LA mode, the test packet is directly written from the output of the 128-bit LA. The top bits of the LA register are used for the control signals during test:
Jesse Cirimeli-Low jcirimel@ucsc.edu Amogh Lonkar alonkar@ucsc.edu Matthew Guthaus mrg@ucsc.edu