fixed the comment mentioning mprj_io[15] to be in_select when it is the reset pin.
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README.md

Caravel User Project

License UPRJ_CI Caravel Build

:exclamation: Important Note

Overview

This project contains a test chip for several OpenRAM memory configurations. The configurations have varying levels of verification. In particular, it has these sizes:

  • sky130_sram_1kbyte_1rw1r_8x1024_8
  • sky130_sram_1kbyte_1rw1r_32x256_8
  • sky130_sram_2kbyte_1rw1r_32x512_8
  • sky130_sram_4kbyte_1rw1r_32x1024_8
  • sky130_sram_8kbyte_1rw1r_32x2048_8
  • sky130_sram_1kbyte_1rw_32x256_8
  • sky130_sram_2kbyte_1rw_32x512_8
  • sky130_sram_4kbyte_1rw_32x1024_8
  • sky130_sram_4kbyte_1rw_32x512_8
  • sky130_sram_8kbyte_1rw_64x1024_8

Test Modes

There are two test modes available. Each one inputs an packet that configures the read and write operations of a particular SRAM. The GPIO pin io_in[16] determines whether to use GPIO (1) or LA mode (0).

Test Packet

The test packet is a 112-bit value that has the follow signals and bit size:

  • chip_select (4)
  • addr0 (16)
  • din0 (32)
  • csb0 (1)
  • web0 (1)
  • wmask0 (1)
  • addr1 (16)
  • din1 (32)
  • csb1 (1)
  • web1 (1)
  • wmask1 (4)

During a read operation, the din bits are replaced with the data output bits so that they can be verified.

Note: The 64-bit memory leaves the middle 32-bits as a value of 0 and instead reads/writes the upper and lower 16-bits to reduce the number of packet bits.

GPIO Mode

In GPIO mode, the test packet is scanned in/out with the GPIO pins in 112 cycles. The GPIO pins used are as follows:

  • Test mode select: in_select io_in[16]
  • Scan reset: resetn: io_in[15]
  • Scan clock: gpio_clk io_in[17]
  • Scan enable: gpio_scan io_in[19]
  • Load SRAM result into register: gpio_sram_load io_in[20]
  • CSB for all SRAM: global_csb io_in[21]
  • Scan input: gpio_in io_in[22]
  • Scan output: gpio_out io_out[22]

LA Mode

In LA mode, the test packet is directly written from the output of the 128-bit LA. The top bits of the LA register are used for the control signals during test:

  • Control register clock: la_clk la_data_in[127]
  • Load control register: la_in_load la_data_in[125]
  • Load SRAM result into register: la_sram_load la_data_in[124]
  • CSB for all SRAM: ??

Authors

Jesse Cirimeli-Low jcirimel@ucsc.edu Amogh Lonkar alonkar@ucsc.edu Matthew Guthaus mrg@ucsc.edu