commit | ea79ae36ae211a0c351d8f242e9c1f9b1963f68d | [log] [tgz] |
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author | AmoghLonkar <alonkar@ucsc.edu> | Sun Jun 27 20:46:38 2021 -0700 |
committer | AmoghLonkar <alonkar@ucsc.edu> | Sun Jun 27 20:46:38 2021 -0700 |
tree | afb0836a92cefde78089c2a71cca7c2827c9ae7f | |
parent | fd295187d3663c70f1584c0946f6ee8612079d68 [diff] |
Updated description to match LA test
:exclamation: Important Note |
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This project contains a test chip for several OpenRAM memory configurations. The configurations have varying levels of verification. In particular, it has these sizes:
There are two test modes available. Each one inputs an packet that configures the read and write operations of a particular SRAM. The GPIO pin io_in[16] determines whether to use GPIO (1) or LA mode (0).
The test packet is a 112-bit value that has the follow signals and bit size:
During a read operation, the din bits are replaced with the data output bits so that they can be verified.
Note: The 64-bit memory leaves the middle 32-bits as a value of 0 and instead reads/writes the upper and lower 16-bits to reduce the number of packet bits.
In GPIO mode, the test packet is scanned in/out with the GPIO pins in 112 cycles. The GPIO pins used are as follows:
In LA mode, the test packet is directly written from the output of the 128-bit LA. The top bits of the LA register are used for the control signals during test: