commit | de193bc2142031929e5c54a25979373939f7806b | [log] [tgz] |
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author | mrg <mrg@ucsc.edu> | Sat Jul 10 15:08:28 2021 -0700 |
committer | mrg <mrg@ucsc.edu> | Sat Jul 10 15:08:28 2021 -0700 |
tree | b81cd6bd9eed8ab0edcfebe82a7b47b30f6c2b47 | |
parent | 2cda10b31636e0b375fd632f954f717e8c0bd166 [diff] |
Fixed final gds merge
:exclamation: Important Note |
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This project contains a test chip for several OpenRAM memory configurations. The configurations have varying levels of verification. In particular, it has these sizes:
There are two test modes available. Each one inputs an packet that configures the read and write operations of a particular SRAM. The GPIO pin io_in[16] determines whether to use GPIO (1) or LA mode (0).
The test packet is a 112-bit value that has the follow signals and bit size:
During a read operation, the din bits are replaced with the data output bits so that they can be verified.
Note: The 64-bit memory leaves the middle 32-bits as a value of 0 and instead reads/writes the upper and lower 16-bits to reduce the number of packet bits.
In GPIO mode, the test packet is scanned in/out with the GPIO pins in 112 cycles. The GPIO pins used are as follows:
In LA mode, the test packet is directly written from the output of the 128-bit LA. The top bits of the LA register are used for the control signals during test: