| Corner/Library Name,Definition Purpose |
| typical,Nominal process/Estimate typical performance |
| ff,"Bound EP specifications extreme Idsat and Vt for wide and narrow short |
| |
| channel FETs. Verify circuit robustness under extreme process condition |
| |
| with fast NFET and fast PFET" |
| ss,"Bound EP specifications extreme Idsat and Vt for wide and narrow short |
| |
| channel FETs. Verify circuit robustness under extreme process condition |
| |
| with slow NFET and slow PFET" |
| fs,"Match Idsat and Vt skew between NFETs and PFETs based on line data |
| |
| and EP specifications. Circuit operation under N to P mismatch, for fast |
| |
| NFET and slow PFET" |
| sf,"Match Idsat and Vt skew between NFETs and PFETs based on line data |
| |
| and EP specifications. Circuit operation under N to P mismatch, for slow |
| |
| NFET and fast PFET" |
