| "Corner/Library |
| |
| Name",Definition Purpose |
| typical,Nominal process/Estimate typical performance |
| ff,"Bound EP specifications extreme Idsat, Vt & Idlin (LDNMOS only) for wide |
| |
| and narrow short channel FETs. Verify circuit robustness under extreme |
| |
| process condition with fast NFET and fast PFET" |
| ss,"Bound EP specifications extreme Idsat, Vt & Idlin (LDNMOS only) for wide |
| |
| and narrow short channel FETs. Verify circuit robustness under extreme |
| |
| process condition with slow NFET and slow PFET" |
| fs,"Match Idsat, Vt & Idlin (LDNMOS only) skew between NFETs and PFETs |
| |
| based on line data and EP specifications. Circuit operation under N to P |
| |
| mismatch, for fast NFET and slow PFET" |
| sf,"Match Idsat, Vt & Idlin (LDNMOS only) skew between NFETs and PFETs |
| |
| based on line data and EP specifications. Circuit operation under N to P |
| |
| mismatch, for slow NFET and fast PFET" |
